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    Kristallwachstum - Wachstum von Zinn-Whiskern im Raster-Elektronenmikroskop

    Documentation/Report
    Kehrer, Hans-Peter / Zaminer, Christian | TIB AV-Portal | 1972
    Schlagwörter: Using a special time-laspe cinematographic technique and a speed of 11 frames per minute it was possible to record the growth of tin whiskers in a scanning-electron microscope. It will be noted that filament-type tin whiskers as well as bulbous shapes grow out ot the specimen which has been heated to 70° C and has an electroplated layer of tin on the surface, which is approximately 1 µm thick. It is apparent from the film that the growth of these whiskers is fed by material from the tin coating which moves upwards from the bottom of the coating. The swaying of the whiskers during growth, and the temperatured relation of the growth rate, become visible in ideal settings.