Synonyme wurden verwendet für: Laser metrology
Suche ohne Synonyme: keywords:("Laser metrology")

1–20 von 54 Ergebnissen
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    Advanced particular digital signal processing in a real-time laser-speckle-correlation-based strain sensor with optical preprocessing [3823-11]

    Kargel, C. / Zagar, B. G. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Alternative methods for wavelength determination: interference filters and double photodiodes [3823-03]

    Bitte, F. / Pfeifer, T. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Application of endoscopic ESPI in NDI [4420-12]

    Hack, E. K. / Society for Optical Engineering / IMEKO - The International Measurement Confederation et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    Avoidance and elimination of errors in optical scanning [3823-27]

    Schulz, M. / Weingaertner, I. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Camera-based active phase stabilization for electronic holography [4420-18]

    Hrebabetzky, F. / Albertazzi, A. / Veiga, C. L. N. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools [4420-08]

    Sousa, A. R. / Schneider, C. A. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique [4420-14]

    de Lemos, J. / Mischo, H. K. / Pfeifer, T. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    Correction of cyclic error in optical waveguide distance meter [3023-15]

    Fujima, I. / Seta, K. / Iwasaki, S. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Design and performance of a low-coherence sensor for industrial applications based on a self-mixing superluminescent diode [3823-32]

    Rovati, L. / Docchio, F. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Design and performance of an optical sensor for the measurement of surface roughness and waviness [3823-30]

    Docchio, F. / Minoni, U. / Rodella, R. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Development of a hightly transparent fluorescent optical sensor for transverse positioning of multiple elements with respect to a reference laser beam [3823-35]

    Barriere, J.-C. / Blumenfeld, H. / Bourdinaud, M. J. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Development of a transparent optical telescope for absolute positioning with respect to a reference laser beam [3823-37]

    Barriere, J.-C. / Cloue, O. / Guyot, C. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    High-precision measurement of cylinder form deviations with grazing incidence interferometry [4420-02]

    Weckenmann, A. / Kersting, T. / Schimke, W. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    High-resolution tomography for scattering media by synthesis of optical coherence function [3823-29]

    He, Z. / Hotate, K. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Holographic modal analysis for the investigation of vibro-acoustic systems [3823-04]

    Haberstok, C. / Freymann, R. / Steinbichler, H. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Holographic vibration analysis by frequency compensation stroboscopic illuminations [3623-14]

    Gusev, M. / Gurevich, V. S. / Isayev, A. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Influence of mechanical stress on the conversion efficiency of KTP and LBO [3823-20]

    Mann, G. / Seidel, S. / Weber, H. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Interferometer for measuring the form figure of aspherical mirrors as used in EUV lithography [3823-26]

    Klaver, R. G. / Van Brug, H. H. / Braat, J. J. M. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: laser metrology

    Interferometric length and roughness measurements with nanometer accuracy level [4420-03]

    Titov, A. / Malinovsky, I. / Belaidi, H. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology

    Interferometric method for in-situ characterization of coating industrial processes [4420-07]

    Michels, A. F. / Horowitz, F. / Society for Optical Engineering et al. | British Library Conference Proceedings | 2001
    Schlagwörter: laser metrology