Synonyme wurden verwendet für: atomic force microscopy
Suche ohne Synonyme: keywords:("atomic force microscopy")

1–15 von 15 Ergebnissen
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    A new mechanical-electrical approach to the wheel-rail contact

    Descartes, S. / Renouf, M. / Fillot, N. et al. | Tema Archiv | 2008
    Schlagwörter: Rasterkraftmikroskopie

    Rotating step by step piezomotor for nanopositioning & space applications

    Six, M.F. / Letty, R. le / Coste, P. et al. | Tema Archiv | 2006
    Schlagwörter: Atomkraftmikroskopie

    MEMS for Space Flight Applications

    Lawton, R. | NTRS | 1998
    Schlagwörter: AFM infrared microscopy IR light emission microscopy LE acoustic microscopy , electron microscopy SEM focused ion beam techniques FIB atomic force microscopy

    Effect of low earth orbit atomic oxygen exposure on phenylphosphine oxide-containing polymers

    Connell, J.W. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    Metal-metal friction characteristics and gear pitting life performance of metal V-belt type CVTFs

    Narita, Keiichi | Tema Archiv | 2012
    Schlagwörter: Atomkraftmikroskopie

    Mechanisms based on piezo actuators

    Claeyssen, F. / Le Letty, R. / Barillot, F. et al. | Tema Archiv | 2001
    Schlagwörter: Atomkraftmikroskopie

    Non-silicone inorganic polymers based coatings for atomic oxygen protection in LEO

    Poire, E. / Sellars, B.G. / Nguyen, D. | Tema Archiv | 1998
    Schlagwörter: Atomkraftmikroskopie

    A study of atomic oxygen interactions with protected silver surfaces

    Gouzman, I. / Grossman, E. / Murat, M. et al. | Tema Archiv | 2003
    Schlagwörter: Atomkraftmikroskopie

    Anti-fouling silicone elastomers for offshore structures

    Weinell, Claus E. / Marsh, Nicholas / Roll, Jan | Tema Archiv | 2006
    Schlagwörter: Rasterkraftmikroskopie

    Intelligent fast 3D - surface quality control and applications in the automotive industry

    Leopold, J. / Günther, H. / Fürderer, K. et al. | Tema Archiv | 2000
    Schlagwörter: Atomkraftmikroskopie

    Nanomaterials for space power

    Raffaelle, Ryne P. / Landi, Brian J. / Cress, Cory et al. | Tema Archiv | 2007
    Schlagwörter: Rasterkraftmikroskopie

    Methods for Determining the Level of Autonomy to Design into a Human Spaceflight Vehicle: A Function Specific Approach

    Proud, Ryan W. / Hart, Jeremy J. / Mrozinski, Richard B. | NTRS | 2003
    Schlagwörter: AFM (AUTONOMOUS FLIGHT MANAGEMENT)

    Atomic oxygen resistant inorganic materials for LEO applications

    Poire, E. / Lachance, J. | Tema Archiv | 1999
    Schlagwörter: Atomkraftmikroskopie

    The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers

    Cole, M.W. / Hubbard, C. / Demaree, D. et al. | Tema Archiv | 1998
    Schlagwörter: Atomkraftmikroskopie