Synonyme wurden verwendet für: Reliability
Suche ohne Synonyme: keywords:(Reliability)

1–14 von 14 Ergebnissen
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    Overview of NASA Automotive Component Reliability Studies

    M. J. Sampson | NTIS | 2016
    Schlagwörter: Quality Control & Reliability , Component reliability

      Overview Of NASA Automotive Component Reliability Studies

      M. J. Sampson | NTIS | 2016
      Schlagwörter: Component reliability

      Overview of NASA Automotive Component Reliability Studies

      M. J. Sampson | NTIS | 2016
      Schlagwörter: Quality Control & Reliability , Component reliability

    Model-Based Assurance Case+ (MBAC+): Tutorial on Modeling Radiation Hardness Assurance Activities

    R. Austin / K. A. Label / M. J. Sampson et al. | NTIS | 2017
    Schlagwörter: Reliability analysis , Reliability

    NASA Electronic Parts and Packaging (NEPP) Program: Overview and Roadmap for FY16

    K. A. LaBel / M. J. Sampson | NTIS | 2016
    Schlagwörter: Reliability engineering , Reliability

      NASA Electronic Parts and Packaging (NEPP) Program: Overview and Roadmap for FY16

      K. A. LaBel / M. J. Sampson | NTIS | 2016
      Schlagwörter: Reliability engineering , Reliability

    NASA Electronic Parts and Packaging (NEPP) Program: Overview and Update FY15 and Beyond

    K. A. LaBel / M. J. Sampson | NTIS | 2016
    Schlagwörter: Quality Control & Reliability , Reliability engineering , Reliability analysis

    Risk Management of Microelectronics: The NASA Electronic Parts and Packaging (NEPP) Program

    K. A. LaBel / M. J. Sampson | NTIS | 2005
    Schlagwörter: Quality Control & Reliability , Reliability

    NASA Presentation to TechAmerica C12 Committee

    K. A. LaBel / M. J. Sampson | NTIS | 2011
    Schlagwörter: Component reliability , Reliability

    NASA Electronic Parts and Packaging (NEPP) Program: An Overview

    K. A. Label / M. J. Sampson | NTIS | 2016
    Schlagwörter: Quality Control & Reliability , Circuit reliability

      NASA Electronic Parts and Packaging (NEPP) Program: An Overview

      K. A. LaBel / M. J. Sampson | NTIS | 2016
      Schlagwörter: Quality Control & Reliability , Circuit reliability

      NASA Electronic Parts and Packaging (NEPP) Program: An Overview

      K. A. Label / M. J. Sampson | NTIS | 2016
      Schlagwörter: Circuit reliability

    Electrical, Electronic and Electromechanical (EEE) Parts in the New Space Paradigm: When is Better the Enemy of Good Enough?

    K. A. LaBel / M. J. Sampson / J. A. Pellish | NTIS | 2018
    Schlagwörter: Reliability analysis

    NASA Electronic Parts Assurance Group (NEPAG) - An Overview

    K. A. Label / M. J. Sampson | NTIS | 2017
    Schlagwörter: Quality Control & Reliability

    Developing a NASA Lead-Free Policy for Electronics - Lessons Learned

    M. J. Sampson | NTIS | 2008
    Schlagwörter: Reliability

    NASA Electrical, Electronic and Electromechanical (EEE) Parts Assurance, An Overview

    K. A. Label / M. J. Sampson | NTIS | 2017
    Schlagwörter: Reliability

    Echoes of the Past, Glimpses of the Future - Ongoing Trends in Assurance of EEE Parts for Spaceflight

    M. J. Sampson | NTIS | 2017
    Schlagwörter: Quality Control & Reliability