Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

21–40 von 95 Ergebnissen
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    Segmentation of the biliary tree in MRCP data [4877-24]

    Robinson, K. / Whelan, P. F. / Stack, J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Perceptually grounded color evaluation in virtual aided recomposition of fragmented frescos [4877-20]

    Renna, F. / Venturino, L. / Attolico, G. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Overview of passive and active vision techniques for hand-held 3D data acquisition [4877-01]

    Mada, S. K. / Smith, M. L. / Smith, L. N. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Registration of ophthalmic images using control points [4877-30]

    Heneghan, C. / Maguire, P. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Semantic description of signal and image databases [4877-28]

    Contreras, P. / Kokuer, M. / Louys, M. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet eye-gaze-based video compression [4877-32]

    Farid, M. M. / Kurugollu, F. / Murtagh, F. D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Application of deconvolution to images from the EGRET gamma-ray telescope [4877-26]

    Charalabides, S. / Shearer, A. / Butler, R. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet processing techniques for weak feature emphasis and extraction [4877-09]

    Brown, T. J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Motion estimation with diffusion [4877-08]

    Condell, J. V. / Scotney, B. W. / Morrow, P. J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Three-dimensional laser ranging image reconstruction using three-line laser sensors and fuzzy methods [3835-12]

    Bursanescu, L. / Hamdi, M. / SPIE | British Library Conference Proceedings | 1999
    Schlagwörter: optical metrology

    Statis omnidirectional stereoscopic display system [3835-10]

    Barton, G. G. / Feldman, S. / Beckstead, J. A. et al. | British Library Conference Proceedings | 1999
    Schlagwörter: optical metrology

    Measurement of total integrated scatter of optical coatings for 157-nm lithography [4449-04]

    Saito, T. / Saito, J. / Nakamura, E. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Measurement of steep aspheres: a step forward to nanometer accuracy [4449-25]

    Weingartner, I. / Schulz, M. / Thomsen-Schmidt, P. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    IR spectroscopic ellipsometry for industrial characterization of semiconductors [4449-09]

    Boher, P. / Bucchia, M. / Piel, J. P. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Present and future industrial metrology needs for qualification of high-quality optical microlithography materials (Invited Paper) [4449-01]

    Engel, A. / Morsen, E. / Jordanov, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Practical applications of laser holography in metrology for 3D imaging and industrial inspection [3520-41]

    Ginzburg, V. M. / SPIE | British Library Conference Proceedings | 1998
    Schlagwörter: optical metrology

    Diffractive solid immersion lenses: characterization and manufacturing [4449-29]

    Brunner, R. / Bischoff, J. / Rudolf, K. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Combined metrology including VUV spectroscopic ellipsometer and grazing x-ray reflectance for precise characterization of thin films and multilayers at 157 nm [4449-06]

    Boher, P. / Evrard, P. / Piel, J. P. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    AFM tip calibration using nanometer-sized structures induced by ion beam sputtering [4449-28]

    Frost, F. / Hirsch, D. / Schindler, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology

    Measuring the scatter distribution of PSL spheres on Si wafers using a fast calibrated CMOS photodetector array [4449-20]

    Rinder, T. / Rothe, H. / SPIE | British Library Conference Proceedings | 2001
    Schlagwörter: optical metrology