1–5 von 5 Ergebnissen
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    In situ and ex situ ellipsometric characterization of oxygen plasma and UV radiation effects on spacecraft materials

    Bungay, C.L. / Tiwald, T.E. / DeVries, M.J. et al. | Tema Archiv | 1998
    Schlagwörter: Ellipsometrie , spektroskopische Ellipsometrie

    Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2 optical coatings

    Memarzadeh, K. / Woollam, J.A. / Belkind, A. | Tema Archiv | 1988
    Schlagwörter: ELLIPSOMETRIE , INZIDENZSPEKTROSKOPISCHE ELLIPSOMETRIE

    Iridium substrates for space contamination studies: Erosion rates under atomic oxygen exposure

    Li, Yan / Woollam, J.A. | Tema Archiv | 2003
    Schlagwörter: Ellipsometrie

    High durability antireflection coatings for silicon and multispectral ZnS

    Joseph, S. / Marcovitch, O. / Yadin, Y. et al. | Tema Archiv | 2007
    Schlagwörter: Ellipsometrie

    The use of electrochemistry and ellipsometry for identifying and evaluating corrosion on aircraft

    Dacres, C.M. / Taggart, B.C. / Anderson, C.R. et al. | Tema Archiv | 1995
    Schlagwörter: Ellipsometrie