1–20 von 55 Ergebnissen
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    Driver state prediction from vehicle signals: An evaluation of segmentation approaches

    Freier Zugriff
    Maritsch, Martin / Koch, Kevin / Thomsen, Hauke et al. | BASE | 2022
    Verlag: Institute of Electrical and Electronics Engineers , KITopen (Karlsruhe Institute of Technologie)

    Blending borescope inspection (BBI) maintenance service equates to cost savings

    Adair, T.L. / Owens, J.L. / Grady, G. et al. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Microtechnology for space systems

    Janson, S. / Helvajian, H. / Amimoto, S. et al. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Evaluation of advanced automotive electrical system architectures using MAESTrO

    Afridi, K.K. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Analytical tools for the management of faster-better-cheaper space missions

    Pate-Cornell, E. / Dillon, R. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    COTS fiber optic interconnect solutions for mobile platforms

    Horwitz, D. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Integrating the cost of satellite sensors and payloads in the space systems architecture decision making process

    Purvis, C.W. / Butterworth, M.L. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Model abstraction techniques: an intuitive overview

    Sisti, A.F. / Farr, S.D. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Assembly issues in replacing a high cost hermetically sealed hybrid with a low cost non-hermetic assembly for prolonged use at 180 degrees C

    Whitehurst, J. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Incremental avionics upgrades for legacy aircraft

    Nelson, J. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    A powertrain control SOI BiCMOS LSI for an automotive application

    Hattori, M. / Kuromiya, S. / Itoh, F. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Fostering collaboration in systems of systems

    Geddes, N.D. / Smith, D.M. / Lizza, C.S. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Air traffic control trainer software development: multi-agent architecture and Java prototype

    Peters, J.F. / Agatep, R. / Cormier, S. et al. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    ATS in the Air Force: the legacy and its challenges

    Holm, D. / Haffarnan, J. / Dean, J. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    SEI level 3 compliance in the TPS industry

    Pressler, D.R. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Designing for determinism: lessons learned from modern real-time avionics applications

    Preston, J.D. / Kegley, R.B. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    A framework for integrating design automation with computer aided parametric estimating (CAPE)

    Walter, T.J. | Tema Archiv | 1997
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Implementation of a 'perfect launch' process to improve the effectiveness of automotive new product ramps

    Hempleman, G.L. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York

    Alternative solders for flip chip applications in the automotive environment

    Jung, E. / Heinricht, K. / Kloeser, J. et al. | Tema Archiv | 1998
    Verlag: Institute of Electrical and Electronics Engineers (IEEE) , New York