1–10 von 2,884 Ergebnissen
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    2D-3D Rigid Registration of X-Ray Fluoroscopy and CT Images Using Mutual Information and Sparsely Sampled Histogram Estimators

    Zollei, L. / Grimson, E. / Norbash, A. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: IEEE

    2D-Affine Invariants that Distribute Uniformly and can be Tuned to any Convex Feature Domain

    Rigoutsos, I. / IEEE; Computer Society | British Library Conference Proceedings | 1998
    Schlagwörter: IEEE

    2D Affine Transformations Cannot Account for Human 3D Object Recognition

    Liu, Z. / Kersten, D. / IEEE; Computer Society | British Library Conference Proceedings | 1998
    Schlagwörter: IEEE

    2D Matching of 3D Moving Objects in Color Outdoor Scenes

    Dubuisson, M.-P. / Jain, A. K. / Institute of Electrical and Electronics Engineers; Computer Society | British Library Conference Proceedings | 1994
    Schlagwörter: IEEE

    2D versus 3D Colour Space Face Detection

    Kovac, J. / Peer, P. / Solina, F. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: IEEE

    3D-2D Projective Registration of Free-Form Curves and Surfaces

    Feldmar, J. / Ayache, N. / Betting, F. et al. | British Library Conference Proceedings | 1995
    Schlagwörter: IEEE

    3D Automated Segmentation and Structural Analysis of Vascular Trees Using Deformable Models

    Magee, D. / Bulpitt, A. / Berry, E. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: IEEE

    3D Biplanar Reconstruction of Scoliotic Vertebrae Using Statistical Models

    Benameur, S. / Mignotte, M. / Parent, S. et al. | British Library Conference Proceedings | 2001
    Schlagwörter: IEEE

    3D Face Recognition using Multiple Features for Local Depth Information

    Lee, Y. / Yi, T. / IEEE et al. | British Library Conference Proceedings | 2003
    Schlagwörter: IEEE

    3D Geometry from Planar Parallax

    Sawhney, H. S. / Institute of Electrical and Electronics Engineers; Computer Society | British Library Conference Proceedings | 1994
    Schlagwörter: IEEE