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journal:(Proceedings of SPIE, the International Society for Optical Engineering)
A mixture of experts approach for SHM measurement processing [6176-27]
Characterization of system sensitivity in SHM event-detection systems [5767-17]
Novel event identification for SHM systems using unsupervised neural computation [5393-25]
Novel event identification for SHM systems using unsupervised neural computation [5393-25]