41–50 von 72 Ergebnissen
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    First evidence of tyre debris characterization at the nanoscale by focused ion beam

    Milani, M. / Pucillo, F.P. / Ballerini, M. et al. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie

    Effect of line pipe steel microstructure on susceptibility to sulfide stress cracking

    Koh, S.U. / Kim, J.S. / Yang, B.Y. et al. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie

    Overview of research on aerospace metallic structural materials

    Rosenstein, A.H. | Tema Archiv | 1991
    Schlagwörter: TRANSMISSIONSELEKTRONENMIKROSKOPIE

    Localised biological corrosion of X52 steel exposed within sea water pipelines

    Romero, J.M. / Angeles-Chavez, C. / Martinez, L. et al. | Tema Archiv | 2002
    Schlagwörter: Transmissionselektronenmikroskopie

    TEM-Zelle zur EMV-Prüfung nach der Kfz-Richtlinie

    Tema Archiv | 1998
    Schlagwörter: TEM-Zelle , TEM (transverse electromagnetic mode)

    Hydrogen-induced cracking and healing behaviour of X70 steel

    Dong, C.F. / Li, X.G. / Liu, Z.Y. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Micro-damage behaviors of Al-6Mg alloy impacted by projectiles with velocities of 1-3.2 km/s

    Zhen, Liangh / Li, G.A. / Zhou, J.S. et al. | Tema Archiv | 2005
    Schlagwörter: Transmissionselektronenmikroskopie

    Analysis of fleet type impact on the threats and errors of an airline using Line Operations Safety Audit (LOSA)

    Freier Zugriff
    Roohollah Khoshkhoo / Alireza Jahangirian / Farzaneh Sharafbafi | DOAJ | 2018
    Schlagwörter: Threat and Error Management (TEM)

    Microstructural investigation of DS200 + Hf superalloy

    Baldan, A. | Tema Archiv | 1989
    Schlagwörter: TRANSMISSIONSELEKTRONENMIKROSKOPIE

    The role of chromium in protective alumina scale formation during the oxidation of ternary TiAlCr alloys in air

    Fox-Rabinovich, G.S. / Weatherly, G.C. / Wilkinson, D.S. et al. | Tema Archiv | 2004
    Schlagwörter: Transmissionselektronenmikroskopie