1–10 von 72 Ergebnissen
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    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archiv | 2010
    Schlagwörter: Transmissionselektronenmikroskopie

    Ageing and toughness of silicon carbide particulate reinforced Al-Cu and Al-Cu-Mg based metal-matrix composites

    Shakesheff, A.J. | Tema Archiv | 1995
    Schlagwörter: Transmissionselektronenmikroskopie

    Ageing behaviour and toughness of silicon carbide particulate reinforced Al-Li-Cu-Mg-Zr metal matrix composites

    Shakesheff, A.J. | Tema Archiv | 1995
    Schlagwörter: Transmissionselektronenmikroskopie

    Analysis of fleet type impact on the threats and errors of an airline using Line Operations Safety Audit (LOSA)

    Freier Zugriff
    Roohollah Khoshkhoo / Alireza Jahangirian / Farzaneh Sharafbafi | DOAJ | 2018
    Schlagwörter: Threat and Error Management (TEM)

    Analysis of Premature Wear-Out of Aircraft Gun Barrel by Applying a Transmission Electron Microscopy (TEM)

    Freier Zugriff
    Łęczycki Krzysztof | DOAJ | 2017
    Schlagwörter: TEM (Transmission Electron Microscopy)

    A sol-gel based magneto-optical device for the NANOSAT space mission

    Zayat, M. / Pardo, R. / Rosa, G. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Burning Rate Characterization of Ammonium Perchlorate Pellets Containing Micro- and Nano-Catalytic Additives

    Rodriguez, Felix A. / Thomas, James C. / Sammet, Thomas E. et al. | AIAA | 2022
    Schlagwörter: Transmission Electron Microscopy

    Catalyst deactivation in on-board H2 production by fuel dehydrogenation

    Lucarelli, Carlo / Pavarelli, Giulia / Molinari, Chiara et al. | Tema Archiv | 2014
    Schlagwörter: HRTEM (High Resolution Transmission Electron Microscopy)

    Characterisation of thermoset laminates for cosmetic automotive applications: Part III - Shrinkage control via nanoscale reinforcement

    Schubel, Peter J. / Johnson, Michael S. / Warrior, Nicholas A. et al. | Tema Archiv | 2006
    Schlagwörter: TEM (Transmissionselektronenmikroskop)