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journal:(Proceedings)

    Statistical calibration of CCD imaging process

    Tsin, Y. / Ramesh, V. / Kanade, T. | IEEE | 2001

    Robust Subspace Clustering by Combined Use of kNND Metric and SVD Algorithm

    Ke, Q. / Kanade, T. / IEEE Computer Society | British Library Conference Proceedings | 2004

    Resolution-Aware Fitting of Active Appearance Models to Low Resolution Images

    Dedeoglu, G. / Baker, S. / Kanade, T. | British Library Conference Proceedings | 2006

    Real-time combined 2D+3D active appearance models

    Jing Xiao, / Baker, S. / Matthews, I. et al. | IEEE | 2004

    Real-Time Combined 2D+3D Active Appearance Models

    Xiao, J. / Baker, S. / Matthews, I. et al. | British Library Conference Proceedings | 2004