IEEE transactions on aerospace and electronic systems
Characterization of EMI/RFI in Commercial and Industrial Electrical Systems
The Connector Life Test System Design
IEEE transactions on aerospace and electronic systems ; 47/48.2011/12
Research on Accelerated Storage Degradation Testing for Aerospace Electromagnetic Relay
Principle of Arc Fault Detection for Solid State Power Controller
Multi-agent traffic simulation with CUDA
Press-fit Connector for Automobile ECUs
2000 technical conference - Pulp & Paper Industry Committee : [conference record]