Synonyme wurden verwendet für: MICROSCOPE
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81–100 von 165 Ergebnissen
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    Dynamic Response of Polymer Ceramic Pressure-Sensitive Paint: Improved Model Considering Thickness Effect

    Jiao, Lingrui / Peng, Di / Liu, Yingzheng | AIAA | 2018
    Schlagwörter: Scanning Electron Microscope

    Effect of Magnetite Nanoparticles’ Modification on Optical Properties of Solar Absorber Coatings

    Strapolova, Victoria N. / Yurtov, Evgeny V. / Muradova, Aytan G. et al. | AIAA | 2017
    Schlagwörter: Transmission Electron Microscope

    Infused Liquid Selection Criteria for Achieving Boiling Enhancements on Liquid-Infused Surfaces

    Cvijovic, Lazar / Sivakumar, Pranav / Kuravi, Sarada et al. | AIAA | 2022
    Schlagwörter: Optical Microscope

    Influence of Cold Expansion and Aggressive Environment on Crack Growth in AA2024-T3

    Shishino, Ken / Leirer, Christopher T. / Mello, Alberto W. | AIAA | 2022
    Schlagwörter: Scanning Electron Microscope

    Catalyst for Lithium Perchlorate Decomposition

    Zhang, Yanwei / Yan, Ke / Qiu, Kunzan et al. | AIAA | 2015
    Schlagwörter: Scanning Electron Microscope

    Adhesive/adherend interlayer property measurement by acoustic microscopy

    Zeller, B.D. / Kinloch, A.J. / Cawley, P. et al. | Tema Archiv | 1997
    Schlagwörter: Mikroskop

    Processing and Characterization of Space-Durable High-Performance Polymeric Nanocomposite

    Iqbal, H. M. S. / Bhowmik, S. / Benedictus, R. et al. | AIAA | 2011
    Schlagwörter: Scanning Electron Microscope

    Microscopy of damage mechanisms in diesel engine pre-combustion chambers in a cyclic oxidising-carburising environment

    Rose, T. / Chalk, C. / Nicholls, J.R. | Tema Archiv | 2009
    Schlagwörter: optisches Mikroskop

    Bimodal Propulsion System for Small Spacecraft: Design, Fabrication, and Performance Characterization

    Little, Bryan / Jugroot, Manish | AIAA | 2020
    Schlagwörter: Scanning Electron Microscope

    Combustion of JP-10-Based Slurry with Nanosized Aluminum Additives

    Luo, Yu / Xu, Xu / Zou, Ji-Jun et al. | AIAA | 2016
    Schlagwörter: Scanning Electron Microscope

    Numerical Calculation of Optical Properties of Silicone-Contaminant Films

    Shimazaki, Kazunori / Numata, Osamu / Miyazaki, Eiji et al. | AIAA | 2016
    Schlagwörter: Scanning Electron Microscope

    Polyethylene-Glycol-Added Water-Droplet Evaporative Cooling for Fast Cooling Operations

    Panda, Anita / Mohapatra, S. S. / Kumar, A. | AIAA | 2019
    Schlagwörter: Scanning Electron Microscope

    Calibration Method of Stereo Microscope Based on Depth Correction

    Wang, Yigang / Jiang, Gangyi / Yu, Mei et al. | Springer Verlag | 2014
    Schlagwörter: stereo microscope

    Fatigue Crack Growth of Friction-Stir-Welded Aluminum Alloy

    Okada, Takao / Machida, Shigeru / Nakamura, Toshiya et al. | AIAA | 2016
    Schlagwörter: Scanning Electron Microscope

    Testing of Refractory Composites for Scramjet Combustors

    Glass, David E. / Capriotti, Diego P. / Reimer, Thomas et al. | AIAA | 2016
    Schlagwörter: Scanning Electron Microscope

    Effect of Curing Agent on the Plateau Burning Mechanism of Solid Propellant Sandwiches

    Gnanaprakash, Kanagaraj / Chakravarthy, Satyanarayanan R. | AIAA | 2018
    Schlagwörter: Scanning Electron Microscope

    Influence of Solution Hydrodynamics on the Deposition of CaSO4 Scale on Aluminum

    Quddus, Abdul / Al-Hadhrami, Luai M. | AIAA | 2011
    Schlagwörter: Scanning Electron Microscope

    Backward-Facing Step Flow in Microchannels Using Microparticle Image Velocimetry

    Yakhshi-Tafti, Ehsan / Cho, Hyoung J. / Kumar, Ranganathan | AIAA | 2011
    Schlagwörter: Scanning Electron Microscope

    Platinum Catalysts Development for 98% Hydrogen Peroxide Decomposition in Pulsed Monopropellant Thrusters

    Dolci, S. / Dell’Amico, D. Belli / Pasini, A. et al. | AIAA | 2015
    Schlagwörter: Scanning Electron Microscope

    Evaluation of Thermal Energy Dynamics in a Compacted High-Conductivity Phase-Change Material

    Darkwa, J. / Su, O. / Zhou, T. | AIAA | 2015
    Schlagwörter: Scanning Electron Microscope