1–7 von 7 Ergebnissen
|

    Single-event effect ground test issues

    Koga, R. | Tema Archiv | 1996

    SEU results from the advanced photovoltaic and electronics experiments (APEX) satellite

    Mullen, E.G. / Ray, K.P. / Koga, R. et al. | Tema Archiv | 1995

    Single event effects and performance predictions for space applications of RISC processors

    Kimbrough, J.R. / Colella, N.J. / Denton, S.M. et al. | Tema Archiv | 1994

    Verification of single event upset rate estimation methods with on-orbit observations (RAMs)

    Shoga, M. / Adams, P. / Chenette, D.L. et al. | Tema Archiv | 1987

    Advantage of advanced CMOS over advanced TTL in a cosmic ray environment

    Sokol, J.H. / Kolasinski, W.A. / Wong, M. et al. | Tema Archiv | 1987

    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archiv | 1987

    Heavy-ion induced single event upsets in a bipolar logic device

    Kolasinski, W.A. / Koga, R. | Tema Archiv | 1983