1–6 von 6 Ergebnissen
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    Next generation tracking and tracing - a new integrated approach

    Jakobs, K. / Williams, R. / Graham, I. et al. | IEEE | 2001

    Evaluation of built-in test

    Pecht, M. / Dube, M. / Natishan, M. et al. | IEEE | 2001

    Atomic force microscopy in zero-g

    Friedfeld, R. / Parker, S. / Rodgers, G. et al. | IEEE | 2003