Surface inspection system for carriage parts [6198-01]
CMOS chip technology for automotive imagers [5663-35]
Infrared thermal detectors versus photon detectors: I. Pixel performance [3182-02]
Photoconductivity of a semiconductor with transverse gradient of electric field [3182-28]
Real-time implementation of a passive ranging algorithm [1956-05]
Dense wavelength division multiplex: research activities at Siemens (Invited Paper) [2893-603]
Photosensitivity studies of Sm^+^2/Sm^+^2 -doped aluminosilicate fiber [2893-538]
Semiconductor lasers in China (Invited Paper) [2886-518]
Advancement and application of HD-WDM technology in China (Invited Paper) [2893-529]
Real-time query system based on three layers [5253-122]
Piezoresistive pressure sensors in CVD diamond for high-temperature applications [5253-78]