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title: proc. of the ieee 1983 Nat. aerospace and electronic conf., naecon
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title: proc. of the ieee 1983 Nat. aerospace and electronics cong., naecon
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title: proc. of the ieee 1993 Nat. aerospace and electronics conf., naecon
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title: prof. of the ieee 1983 Nat. aerospace and electronics conf., naecon
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title: proc. of the ieee 1983 Nat. aerospace and electronics conn., naecon
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title: Proc. of the IEEE 1983 Nat. Aerospace and Electronics Conf., NAECON
The reliability analysis of a separated, dual fail operational redundant strapdown IMU
Variable apparent temperature targets for thermal imaging sensors