Synonyme wurden verwendet für: microscopy
Suche ohne Synonyme: keywords:(microscopy)

1–9 von 9 Ergebnissen
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    MIDAS: Lessons learned from the first spaceborne atomic force microscope

    Bentley, Mark Stephen / Arends, Herman / Butler, Bart et al. | Elsevier | 2016
    Schlagwörter: Atomic force microscopy

    Effect of 10 MeV electron irradiation on polyimide composites for space systems

    Cherkashina, N.I. / Pavlenko, V.I. / Abrosimov, V.M. et al. | Elsevier | 2021
    Schlagwörter: scanning electron microscopy , atomic force microscopy

    Dynamic phase microscopy, a new method to detect viable and killed spores and to estimate the heterogeneity of spore populations

    Tychinsky, Vladimir P. / Mulyukin, Andrey L. / Lisovskii, Vitalii V. et al. | Elsevier | 2007
    Schlagwörter: Novel microscopy method , Dynamic phase microscopy

    The chemical composition of micrometeoroids impacting upon the solar arrays of the Hubble Space Telescope

    Kearsley, A.T. / Graham, G.A. / McDonnell, J.A.M. et al. | Elsevier | 2006
    Schlagwörter: Analytical electron microscopy

    Decrease of contractile properties and transversal stiffness of single fibers in human soleus after 7-day “dry” immersion

    Ogneva, I.V. / Ponomareva, E.V. / Kartashkina, N.L. et al. | Elsevier | 2010
    Schlagwörter: Atomic force microscopy

    Ionizing radiation-induced fragmentation of plasmid DNA – Atomic force microscopy and biophysical modeling

    Psonka, K. / Gudowska-Nowak, E. / Brons, S. et al. | Elsevier | 2007
    Schlagwörter: Atomic force microscopy

    Surface scratches on vehicle windscreens

    Locke, J. / Rockett, L.A. | Elsevier | 1986
    Schlagwörter: Microscopy

    Crystallographic oxide phase identification of char deposits obtained from space shuttle Columbia window debris

    Olivas, J.D. / Wright, M.C. / Christoffersen, R. et al. | Elsevier | 2010
    Schlagwörter: Transmission electron microscopy (TEM)

    Impacts on Hubble Space Telescope solar arrays: Discrimination between natural and man-made particles

    Kearsley, A.T. / Drolshagen, G. / McDonnell, J.A.M. et al. | Elsevier | 2005
    Schlagwörter: Analytical electron microscopy