1–20 von 58 Ergebnissen
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    ATS-6 Radio Beacon Experiment: The First Year

    Davies, K. / Fritz, R. B. / Grubb, R. N. et al. | IEEE | 1975

    FDI Performance of Two Redundant Sensor Configurations

    Gai, E. / Harrison, J. V. / Daly, K. C. | IEEE | 1979

    Telerobotics: problems and research needs

    Stark, L. / Tendick, F. / Kim, W. et al. | IEEE | 1988

    Femtosecond time-reversal in photorefractive polymers

    Giessen, H. / Christ, A. / Wagner, A. et al. | IEEE | 1999

    Traveling-wave scheme for the transient pumping of x-ray laser with a sub-ps TW pulse

    Chanteloup, J.C. / Salmon, E. / Sauteret, C. et al. | IEEE | 1999

    Recent advances in multi-functional structures

    Fosness, E. / Guerrero, J. / Qassim, K. et al. | IEEE | 2000

    Intrepid digital microwave. A new approach to bistatic radar

    Cheal, J. / Foley, E. / Harman, K. | IEEE | 2001

    Improving intrusion detection radar

    Foley, E. / Harman, K. / Cheal, J. | IEEE | 2002

    Novel properties of photonic-band-gap waveguides

    Notomi, M. / Shinya, A. / Kuramochi, E. et al. | IEEE | 2002

    Fabrication and evaluation of submicron-square Si wire waveguides with spot size converters

    Tsuchizawa, T. / Watanabe, T. / Tamechika, E. et al. | IEEE | 2002

    A fiber-based vertically emitting semiconductor laser at 850 nm

    Balocchi, A. / Warburton, R.J. / Kutschera, H.-J. et al. | IEEE | 2002

    Optical stimulation of neural tissue

    Mahadevan-Jansen, A. / Mariappan, K. / Albea, J. et al. | IEEE | 2003

    Soft X-ray microscopy and EUV lithography: imaging in the 20-40 nm regime

    Attwood, D. / Anderson, E. / Chao, W. et al. | IEEE | 2003

    XTCE: a standard XML-schema for describing mission operations databases

    Simon, G. / Shaya, E. / Rice, K. et al. | IEEE | 2004

    Coherent communications, imaging and targeting

    Stappaerts, E. / Baker, K. / Gavel, D. et al. | IEEE | 2004

    The Herschel-Heterodyne Instrument for the Far-Infrared (HIFI)

    de Graauw, T. / Caux, E. / Gusten, R. et al. | IEEE | 2004