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Ihre Suche:
person:(Hariharan, P. R.)

    Interferometric measurements of deviations from flatness: some new techniques (Invited Paper) [3479-01]

    Hariharan, P. / SPIE | British Library Conference Proceedings | 1998
    Beteiligte: Pryputniewicz, R. J. , Juptner, W. P. O.

    Achromatic phase shifting for polarization interferometry [2860-11]

    Hariharan, P. / Roy, M. / SPIE | British Library Conference Proceedings | 1996
    Beteiligte: Pryputniewicz, R. J.

    Optical flat surfaces: subtraction of small-scale irregularities of the reference surface [2860-35]

    Hariharan, P. / Suchting, M. A. / SPIE | British Library Conference Proceedings | 1996
    Beteiligte: Pryputniewicz, R. J.