X-ray analysis of strain relaxation in multilayer systems In~xGa~1~-~xAS~1~-~yN~y/GaAs [5477-28]
Using speckled speckles in high-resolution measurement of bioflow [3904-62]
Use of acoustic waves in x-ray topography of silicon crystals [5477-27]
Unusual multiple x-ray transmissions in crystals with one-dimensional strains [3904-54]
Unique optical fiber amplifier with periodic gain and index corrugations (Invited Paper) [2108-59]
Treatment of light scattering by a rough surface in terms of three-dimensional spectrum [2108-39]
Three-dimensional speckles: static and dynamic properties (Invited Paper) [3904-84]
Three-beam x-ray diffraction in crystals with thin strain layers [5477-25]
Thermo-optic matrix recording media base of doped d-metal oxides [2108-29]
The examinations of microorganisms by correlation optics method [5477-67]
The coherence of multifrequency optical fields (Invited Paper) [5477-02]
Temperature variation of optical bistability of a semiconductor [2108-77]
Temperature behavior of exciton absorption bands in layer semiconductors [5477-30]
Techniques and devices for optical correlation diagnostics of rough surfaces [5477-44]
Synthesized phase objects instead of real ones for optical-digital recognition systems [5477-50]