The Optimized Wavelength Combinations of Two Broadband Sources for White Light Interferometry
Scanning in a white light interferometer using a tunable laser
ENGIN-A Neutron Spectrometer for Internal Stress Measurement in Lightweight Engineering Structures
X-ray focusing system: a new x-ray lens and its applications (Invited Paper) [2321-23]
Long-focal-length hybrid optical system with secondary spectrum corrected [2321-211]
Optoelectronic interconnection networks for image-switching (Invited Paper) [2321-184]
Coordinate-transformation joint-transform correlator invariant to scale and rotation [2321-168]
Feedback-generated holograms and their tolerance to aberration [2321-158]
Infrared gas monitoring with high-sensitivity, stability, and specificity (Invited Paper) [2321-108]
Ultrafast time-resolved optical multichannel analyzer [2321-53]
Active interferometers for shape and deformation measurements (Invited Paper) [2321-47]
Effect of piezoelectricity on the photorefractive gain in a bismuth silicate crystal [2321-38]
Bifocus diffractive lens with binary phase levels [2321-27]
0-3 nanocomposites for optoelectronics and nonlinear optics (Invited Paper) [2321-04]