X-ray diffraction analysis of self-organized InAs quantum dots [2897-536]
X-ray determination of the thermal expansion of TiN, TiC and Ti(N,C) crystals [3179-33]
X-ray detectors with micron resolution based on Kumakhov optics [2859-09]
X-ray chemical microanalyzer with Kumakhov optics [4765-24]
X-ray characterization of an XMM mandrel at the European Synchrotron Radiation Facility [2515-12]
X-ray CCD calibration for the AXAF CCD Imaging Spectrometer [3444-16]
X-ray capillary system for hard x-ray astronomy [3444-42]
X-ray calibration of telescopes on board the ASTRO-E satellite [3444-61]
X-ray bubble lens and x-ray hollow plastic ball lens [3449-28]
X-ray assembly for phase and element analysis of inorganic materials [4765-28]
X-ray and neutron polycapillary optics: status and perspectives (Invited Paper) [2859-34]
X-ray and EUV spectral instruments for plasma source characterization [5196-32]
X-ray analysis of strain relaxation in multilayer systems In~xGa~1~-~xAS~1~-~yN~y/GaAs [5477-28]
X-ray agricultural product inspection: segmentation and classification [3205-06]
X-ray adaptive mirror: principle and state of the art [1920-15]
X-pinch source characteristics for x-rays above 10 keV [5196-05]