1–6 von 6 Ergebnissen
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    NASA's In-Space Propulsion Technology Project Overview and Mission Applicability

    Kremic, Tibor / Anderson, David J. / Dankanich, John W. | IEEE | 2008

    Observed and simulated LET spectra comparison for the CRaTER instrument on LRO

    Anderson, J. A. / Townsend, L. W. / Spence, H. et al. | IEEE | 2012

    The Mars '07 North Polar Cap deep penetration cryo-scout mission

    Zimmerman, W. / Scott Anderson, F. / Carsey, F. et al. | IEEE | 2002

    New demonstration technique of 20 nm spatial resolution soft X-ray microscopy

    Chao, W. / Anderson, E. / Denbeaux, G. et al. | IEEE | 2003

    Soft X-ray microscopy and EUV lithography: imaging in the 20-40 nm regime

    Attwood, D. / Anderson, E. / Chao, W. et al. | IEEE | 2003