1–3 von 3 Ergebnissen
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    New on-chip screening of gate oxides smart power devices for automotive applications

    Malandruccolo, V. / Ciappa, M. / Rothleitner, H. et al. | Tema Archiv | 2009
    Efficient screening procedures for the control of the gate oxide defectivity are vital to limit early failures especially in critical ...
    Verlag: IEEE Operations Center , Piscataway

    In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications

    Malandruccolo, V. / Ciappa, M. / Fichtner, W. et al. | Tema Archiv | 2010
    Efficient screening procedures for the control of the defectivity are vital to limit early failures especially in critical automotive ...
    Verlag: IEEE Operations Center , Piscataway

    In situ screening techniques for defective oxides in devices for automotive applications

    Malandruccolo, V. / Ciappa, M. / Fichtner, W. et al. | Tema Archiv | 2011
    Efficient screening procedures for the control of the defectivity are vital to limit early failures especially in critical automotive ...
    Verlag: IEEE Operations Center , Piscataway