Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

1–20 von 114 Ergebnissen
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    Permanently updated 3D-model of actual geometries of research environments

    Freier Zugriff
    Rauscher, Fiete / Fuchs, Mara / Ghanjaoui, Yassin et al. | Springer Verlag | 2023
    Schlagwörter: Optical metrology

    Bifocal Metrology Applications in Space Engineering

    Bresciani, Fulvio / Fasano, Giorgio / Pintér, János D. | Springer Verlag | 2023
    Schlagwörter: Bifocal metrology , Optical head , Optical system sizing

    Rules for Optical Testing

    H. P. Stahl | NTIS | 2016
    Schlagwörter: Optical measurement , Optical properties , Metrology

    Overview of Differential Deposition at NASA MSFC

    M. Gubarev | NTIS | 2016
    Schlagwörter: Metrology , Optical coatings

    Toolbox of Metrology-Based Techniques for Optical System Alignment

    P. Coulter / R. G. Ohl / D. A. Kubalak et al. | NTIS | 2016
    Schlagwörter: Optical measuring instruments , Metrology

      Toolbox of Metrology-Based Techniques for Optical System Alignment

      P. Coulter / R. G. Ohl / S. L. Hicks et al. | NTIS | 2016
      Schlagwörter: Metrology , Optical measuring instruments , Optical equipment

    Development of X-Ray Optics at MSFC

    M. V. Gubarev | NTIS | 2014
    Schlagwörter: Optical microscopes , Optical correction procedure , Metrology

    Testing the James Webb Space Telescope (JWST) Primary Mirror

    H. P. Stahl | NTIS | 2014
    Schlagwörter: Optical equipment , Metrology

    NASA Funding Opportunities for Optical Fabrication and Testing Technology Development

    H. P. Stahl | NTIS | 2013
    Schlagwörter: Optical equipment , Metrology

    Coherent matter wave inertial sensors for precision measurements in space

    Le Coq, Y. / Retter, J.A. / Richard, S. et al. | Elsevier | 2011
    Schlagwörter: Optical cooling and trapping , Metrology

    Surface Profile Correction of Replicated X-Ray Optics Through Differential Deposition

    K. Kilaru / C. Atkins / B. D. Ramsey et al. | NTIS | 2011
    Schlagwörter: Optical Detection , Metrology

    Differential Deposition for Figure-Corrections in Grazing-Incidence X-Ray Optics

    K. Kilaru / B. D. Ramsey / M. Gubarev et al. | NTIS | 2011
    Schlagwörter: Optical Detection , Metrology

    Rules for Optical Metrology

    H. P. Stahl | NTIS | 2011
    Schlagwörter: Metrology , Optical equipment

    Deformation analysis of aircraft wheels using a speckle shearing interferometer

    Ibrahim, J S / Petzing, J N / Tyrer, J R | SAGE Publications | 2004
    Schlagwörter: optical method , metrology

    Two- and three-dimensional vision systems for inspection, control, and metrology II : 26 - 27 October 2004, Philadelphia, Pennsylvania, USA

    Denshi Jōhō Tsūshin Gakkai, Tsūshin Sosaieti | TIBKAT | 2004
    Schlagwörter: Metrology , Optical measurements , Optical methods

    Two- and three-dimensional vision systems for inspection, control, and metrology : 29 - 30 October 2003, Providence, Rhode Island, USA

    Batchelor, Bruce G. | TIBKAT | 2004
    Schlagwörter: Optical pattern recognition systems , Metrology , Optical measurements

    Eye movements and voice as interface modalities to computer systems [4877-14]

    Farid, M. M. / Murtagh, F. D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Optical device for computation of binocular stereo disparity with a single static camera [4877-03]

    Vernon, D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Correction of geometric image distortion using FPGAs [4877-02]

    Eadie, D. / Shevlin, F. P. / Nisbet, A. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    FPGA-based coprocessor for matrix algorithms implementation [4877-34]

    Amira, A. / Bensaali, F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Machine vision methods for the grading of crushed aggregate [4877-33]

    Qiao, X. / Murtagh, F. D. / Crookes, D. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology