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Acceptance checking methods for UHF electronic components
Advanced IGBT modules for railway traction applications: Reliability testing
A lightweight 8-14 micrometer thermal imager
A R-evolution in power electronics: from "intelligent" to "super smart power" in automotive
Bipolar phototransistors reliability assessment for space applications
Definition of driver information instrumentation feature
Detection of tin plating and tin whisker mitigation
Electronic Warfare: Military needs propel mini-RPVs into tactical flight tests
Fabrication, packaging, and performance of VCSELs and photodetectors for space applications
IEEE Applications Society, 10th IAS Annual Meeting, Hyatt Regency Atlanta, 28. Sept. - 2. Oct., 1975
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Long term reliability testing of HV-IGBT modules in worst case traction operation
Microelectronics for space applications - challenges and opportunities
New on-chip screening of gate oxides smart power devices for automotive applications
On-chip reliability investigations on power modules actually working in inverter systems