1–20 von 26 Ergebnissen
|

    Time evolution of the screening of piezoelectric fields in InGaN quantum wells

    Brown, I.H. / Smowton, P.M. / Blood, P. et al. | IEEE | 2005

      Time evolution of the screening of piezoelectric fields in InGaN quantum wells

      Brown, I.H. / Smowton, P.M. / Blood, P. et al. | IEEE | 2005

    The role of strain and well-width in 635nm laser performance

    Smowton, P.M. / Lewis, G.M. / Chow, W.W. et al. | IEEE | 2003

    The role of drift leakage in GaN/(x5)InGaN QW-LEDs emitting at 480nm

    Pope, I.A. / Smowton, P.M. / Blood, P. et al. | IEEE | 2002

    The effect of nitrogen in InGaAsN quantum well lasers

    Palmer, D.J. / Smowton, P.M. / Blood, P. et al. | IEEE | 2004

    The differential efficiency of quantum well lasers

    Smowton, P.M. / Blood, P. | IEEE | 1996

    The differential efficiency of GaInP quantum well lasers

    Smowton, P.M. / Blood, P. | IEEE | 1996

    Simulation and observation of carrier leakage in 670 nm GalnP quantum well lasers

    Foulger, D.L. / Smowton, P.M. / Wood, S. et al. | IEEE | 1997

    Self-sustained Q-switching in InGaAs quantum dot lasers

    Matthews, D.R. / Summers, H.D. / Smowton, P.M. et al. | IEEE | 2002

    Screening of Piezoelectric Fields in InGaN Quantum Well Laser Structures

    Brown, I.H. / Blood, P. / Smowton, P.M. et al. | IEEE | 2006

    Piezoelectric field effects in InGaN quantum wells

    Brown, I.H. / Pope, I.A. / Smowton, P.M. et al. | IEEE | 2003

    Optimization of gain in multilayer GaInP quantum dots

    Smowton, P.M. / Lutti, J. / Lewis, G.M. et al. | IEEE | 2004

    Optimisation of 635 nm tensile strained GaInP laser diodes

    Smowton, P.M. / Lewis, G.M. / Chow, W.W. et al. | IEEE | 2002

    Measurement of spontaneous emission spectra of diode laser structures

    Lewis, G.M. / Smowton, P.M. / Thomson, J.D. et al. | IEEE | 2001

    Maximising the Gain and Minimising the Non-Radiative Recombination in 1.3μm Quantum Dot Lasers

    Smowton, P.M. / Sandall, I.C. / Walker, C.L. et al. | IEEE | 2006