1–20 von 70 Ergebnissen
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    Cost Effective Radiation Testing of Commercially Available Memories

    Harboe Soerensen, R. S. / Mueller, R. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Evaluation of a Photo-Imageable Multilayer Thick Film Technology

    Cazenave, J. P. / Puig, O. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Hybrid Procurements in the US in Accordance with MIL-PRF-38534C and Conclusions/Recommendations with a View to ESA PSS-01-608

    Jakubek, K. G. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    A Stress Analysis of Large-Size Plastic Encapsulated Microelectronics with Thermal Cycle Test

    Makihara, A. / Ooura, A. / Iwaoka, M. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Californium-252 SEE Evaluation of 32-bit Floating Point DSP Test Systems

    Harboe Soerensen, R. S. / Armbruster, P. / Mueller, T. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Rad-Hard / Hi-Rel FPGA

    Wang, J. J. / Cronquist, B. E. / McGowan, J. E. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    An Assessment of Long Term Degradation Mechanisms in GaAs MMICs

    Lindsay, C. E. / Garat, F. / Bolbot, P. H. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Reliability Behaviour of a Radiation Tolerant 0.6 m CMOS Technology

    Courrege, J. C. / Venturin, J. L. / Bezerra, F. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Critical Concerns, Solutions and Guidelines for Use of Plastic-Encapsulated Microcircuits for Space Flight Applications

    Virmani, N. / Shaw, J. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Improving Reliability of Electronic Assemblies Using Early Physical and Electrical Indicators

    Ousten, Y. / Ponomarenko, S. / Castillan, P. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Applications of Trap Characterisation in III-V Devices: Modeling and/or Technological Improvement

    Saysset, N. / Dumas, J. M. / Danto, Y. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Colloquium: From Microengineering to Nanotechnology

    Whatmore, R. W. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs

    Nemoto, N. / Matsuzaki, K. / Aoki, J. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Flight Usage of Microwave Transistor Life Test Samples

    Fidler, R. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Boundary Scan: Moving Test Up to Higher Integration Levels

    Stearns, B. S. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    THX 7887A: et TH 7888A: deux nouveaux capteurs d'images CCD de 1024 x 1024 pixels et a fort debit

    Boucharlat, G. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    CTS21 & CTC21: Solid Tantalum Capacitors for Switching Power Supplies and Converters

    Boistuaud, T. / D'Alessio, N. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    The Conversion to Space Parts Standardisation - A Manufacturer's Prospective

    Strickler, S. E. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    The Use and Abuse of Hast

    Sinnadurai, N. / European Space Agency | British Library Conference Proceedings | 1997
    Schlagwörter: EECC

    Hot Carrier Reliability Simulation for CMOS Analog Circuits

    Pressecq, F. / Bordonado, B. / Noullet, J. L. et al. | British Library Conference Proceedings | 1997
    Schlagwörter: EECC