21–40 von 92 Ergebnissen
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    The design for an innovative semi-automatic die bonder

    Matthews, K. / Cady, R. / Kelley, M. et al. | IEEE | 2004

    Okapi-Chamfer matching for articulate object recognition

    Hanning Zhou, / Thomas Huang, | IEEE | 2005

    3D Pose Estimation of Cactus Leaves using an Active Shape Model

    Moeslund, Thomas B. / Aagaard, Michael / Lerche, Dennis | IEEE | 2005

    Iris identification and robustness evaluation of a wavelet packets based algorithm

    Rossant, F. / Eslava, M.T. / Thomas, E.A. et al. | IEEE | 2005

    Line shape analysis of single excitons and trions in CdSe nanorods

    Le Thomas, N. / Selle, T. / Herz, E. et al. | IEEE | 2005

    Electromagnetic modes of a linear chain of nanoparticles

    Thomas, M. / Bourguignon, J. / Laroche, M. et al. | IEEE | 2005

    Quantitative Two-photon Flow Cytometry

    Zhong, C.F. / Jing Yong Ye, / Norris, T.B. et al. | IEEE | 2005

    Multiphoton in vivo flow cytometry

    Cheng Frank Zhong, / Jing Yong Ye, / Norris, T.B. et al. | IEEE | 2005

    Double-clad photonic-crystal-fiber based scanning microscopy

    Ye, J.Y. / Myaing, M.T. / Norris, T.B. et al. | IEEE | 2005

    Raman gain measurements of thallium-tellurium oxide glasses

    Stegeman, R. / Rivero, C. / Richardson, K. et al. | IEEE | 2005

    Observation of Monoenergetic Relativistic Electron Beams from Intense Laser - Plasma Interactions

    Mangles, S.P.D. / Murphy, C.D. / Najmudin, Z. et al. | IEEE | 2005

    Submillimeter-wave and Terahertz Diodes, Components and Subsystems

    Crowe, Thomas W. / Porterfield, David W. / Hesler, Jeffrey L. et al. | IEEE | 2006

    Lessons learned building a general purpose cluster for space mission applications

    Davis, B. / AuYeung, M. / Clark, M. et al. | IEEE | 2006

    Forward

    Beranek, Mark / Dermis, Thomas | IEEE | 2007

    End-of-Life Insertion Loss Methodology

    Newland, Scott / Hardy, Douglas / Goodwin, Thomas | IEEE | 2007

    From Requirements to Statistical Testing of Embedded Systems

    Bauer, Thomas / Bohr, Frank / Landmann, Dennis et al. | IEEE | 2007