1–20 von 95 Ergebnissen
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    4D volumetric imaging system [4877-35]

    Ansbro, E. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Segmentation of the biliary tree in MRCP data [4877-24]

    Robinson, K. / Whelan, P. F. / Stack, J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Perceptually grounded color evaluation in virtual aided recomposition of fragmented frescos [4877-20]

    Renna, F. / Venturino, L. / Attolico, G. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Overview of passive and active vision techniques for hand-held 3D data acquisition [4877-01]

    Mada, S. K. / Smith, M. L. / Smith, L. N. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Eye movements and voice as interface modalities to computer systems [4877-14]

    Farid, M. M. / Murtagh, F. D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Optical device for computation of binocular stereo disparity with a single static camera [4877-03]

    Vernon, D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Correction of geometric image distortion using FPGAs [4877-02]

    Eadie, D. / Shevlin, F. P. / Nisbet, A. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Benchmarking segmentation results using a Markov model and a Bayes information criterion [4877-31]

    Murtagh, F. D. / Qiao, X. / Crookes, D. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Automated synthesis, insertion, and detection of polyps for CT colonography [4877-23]

    Sezille, N. / Sadleir, R. J. T. / Whelan, P. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Using quantitative statistics for the construction of machine vision systems (Keynote Address) [4877-12]

    Thacker, N. A. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Robust 3D landmark tracking using trinocular vision [4877-27]

    Mallon, J. / Ghita, O. / Whelan, P. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Bayesian segmentation and clustering for determining cloud mask images [4877-19]

    Barreto, D. / Murtagh, F. D. / Marcello, J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet eye-gaze-based video compression [4877-32]

    Farid, M. M. / Kurugollu, F. / Murtagh, F. D. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Application of deconvolution to images from the EGRET gamma-ray telescope [4877-26]

    Charalabides, S. / Shearer, A. / Butler, R. F. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Adaptive wavelet processing techniques for weak feature emphasis and extraction [4877-09]

    Brown, T. J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Motion estimation with diffusion [4877-08]

    Condell, J. V. / Scotney, B. W. / Morrow, P. J. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Three-dimensional imaging, compression, and reconstruction of digital holograms [4877-13]

    Naughton, T. J. / Frauel, Y. / Matoba, O. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Electron multiplying CCDs [4877-07]

    Denvir, D. J. / Conroy, E. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Registration of ophthalmic images using control points [4877-30]

    Heneghan, C. / Maguire, P. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology

    Semantic description of signal and image databases [4877-28]

    Contreras, P. / Kokuer, M. / Louys, M. et al. | British Library Conference Proceedings | 2003
    Schlagwörter: optical metrology