Leaky waveguide laser diodes for advances manufacturing and metrology [2860-38]
Source modulation for phase shifting in static and dynamic speckle shearing interferometry [2860-30]
Precise surface measurement by local sampling phase-shifting technique [2860-14]
Fourier transform technique for phase unwrapping with minimized boundary effects [2860-06]
Smart fringe image processing system [2860-02]
Design of a 24-in. phase-shifting Fizeau interferometer [2860-50]
Spatial domain method of DSPI fringe pattern recognition [2860-39]
Optical flat surfaces: subtraction of small-scale irregularities of the reference surface [2860-35]
Feedback type of laser diode interferometer with an optical fiber [2860-25]
Nonoptical surface measurement by oblique incidence interferometry [2860-34]
Two-color laser speckle shift strain measurement system [2860-51]
Unwrapping of noisy phase maps: a comparison of two methods [2860-07]
Achromatic phase shifting for polarization interferometry [2860-11]
Double shear speckle interferometry for curvature measurement [2860-21]
Optical device positioning by using Becke lines [2860-31]
Phase-shifted real-time laser feedback interferometry [2860-29]