1–20 von 24 Ergebnissen
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    Designing Accelerated Tests Of Electromigration

    Buehler, Martin G. | NTRS | 1991

    Asymmetrical SRAM Cells For Radiation Tests

    Buehler, Martin G. | NTRS | 1989

    Asymmetric Memory Circuit Would Resist Soft Errors

    Buehler, Martin G. / Perlman, Marvin | NTRS | 1990

    Five-Segment Interconnection For Electromigration Tests

    Hannaman, David J. / Buehler, Martin G. | NTRS | 1991

    Measuring Critical Charges For Single-Event Upsets

    Buehler, Martin G. / Blaes, Brent R. | NTRS | 1988

    Exact Chord-Length Distribution For SEU Calculations

    Buehler, Martin G. / Luke, Keung L. | NTRS | 1990

    Advanced p-MOSFET Ionizing-Radiation Dosimeter

    Buehler, Martin G. / Blaes, Brent R. | NTRS | 1994

    Addressable-Matrix Integrated-Circuit Test Structure

    Sayah, Hoshyar R. / Buehler, Martin G. | NTRS | 1991

    Timing Sampler For Delay Measurements

    Blaes, Brent R. / Buehler, Martin G. | NTRS | 1989

    Test Structures For Bumpy Integrated Circuits

    Buehler, Martin G. / Sayah, Hoshyar R. | NTRS | 1989

    Thermal-Interaction Matrix For Resistive Test Structure

    Buehler, Martin G. / Dhiman, Jaipal K. / Zamani, Nasser | NTRS | 1990

    Predicting Lifetimes Of CMOS ASIC's From Test Data

    Buehler, Martin G. / Zamani, Nasser / Zoutendyk, John A. | NTRS | 1993

    Prospecting for In Situ Resources on the Moon and Mars Using Wheel-Based Sensors

    Buehler, Martin G. / Anderson, Robert C. / Seshadri, Suresh et al. | NTRS | 2005

    Low Cost Environmental Sensors for Spaceflight: NMP Space Environmental Monitor (SEM) Requirements

    Garrett, Henry B. / Buehler, Martin G. / Brinza, D. et al. | NTRS | 2005

    Making A D-Latch Sensitive To Alpha Particles

    Buehler, Martin G. / Blaes, Brent R. / Nixon, Robert H. | NTRS | 1994

    Integrating intrinsic mobility into unmanned ground vehicle systems

    Brosinsky, Chris A. / Penzes, Steven G. / Buehler, Martin G. et al. | SPIE | 2001

    Cross-Quint-Bridge Resistor

    Hannaman, David J. / Lieneweg, Udo / Buehler, Martin G. et al. | NTRS | 1991