Application of advanced sensors to the liquid phase epitaxy (LPE) growth of MCT [2228-39]
Large-area x-ray topographic screening of II-VI substrates and epilayers [2228-30]
Wideband magneto-optical characterization of HgCdTe [2228-33]
Automated radiometric cryoprobe of IR focal plane array wafers [2228-29]
Ultrafast molecular beam epitaxy (MBE) CdTe photoconductor array for synchrotron radiation [2228-21]
Commercialization of liquid phase epitaxy (LPE) HgCdTe material, detectors, and arrays [2228-20]
Large-volume production of HgCdTe by dipping liquid phase epitaxy [2228-36]
Producibility of Vertically Integrated Photodiode (VIP)[TM] scanning focal plane arrays [2228-24]