Synonyme wurden verwendet für: Prüfung
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1–50 von 5,641 Ergebnissen
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    0.1 mu m InGaAs/InAlAs/InP HEMT MMICs - a flight qualified technology

    Chou, Y.C. / Leung, D. / Lai, R. et al. | Tema Archiv | 2002
    Schlagwörter: Prüfung integrierter Schaltungen

    1/9-Scale Saturn Model

    NTRS | 1960
    Schlagwörter: Spacecraft Design, Testing And Performance

    2D Modeling of pulsed THz interrogation of SOFI with knit lines

    Banks, H.T. / Gibson, N.L. / Winfree, W.P. | Tema Archiv | 2007
    Schlagwörter: zerstörungsfreie Prüfung

    3D architectures for highly capable focal plane arrays [2474-39]

    Carson, J. C. / Hornback, W. B. / SPIE | British Library Conference Proceedings | 1995
    Schlagwörter: focal plane array testing

    3D cohesive modelling of hydrogen embrittlement in the heat affected zone of an X70 pipeline steel – Part II

    Alvaro, Antonio / Olden, Vigdis / Akselsen, Odd Magne | Tema Archiv | 2014
    Schlagwörter: bruchmechanische Prüfung

    3D FEM analysis in magnetic flux leakage method

    Huang, Z. / Que, P. / Chen, L. | Tema Archiv | 2006
    Schlagwörter: zerstörungsfreie Prüfung

    3D finite element analysis of marine steel plate magnetic leakage testing

    Li, Han-Lin / He, Yi-dong / Lin, Jun-ming et al. | Tema Archiv | 2008
    Schlagwörter: zerstörungsfreie Prüfung

    3-D POD probability of detection for subsurface defects

    Rummel, W.D. | Tema Archiv | 2005
    Schlagwörter: zerstörungsfreie Prüfung

    3D-Schallfeldsteuerung mit Matrixarrays für die Pipelineprüfung

    Schenk, Gottfried / Brackrock, Daniel / Boehm, Rainer et al. | Tema Archiv | 2013
    Schlagwörter: zerstörungsfreie Prüfung

    3D tomographic visualisation of an aluminium manifold specimen on experimental gamma-ray tomographic system

    Kumar, U. / Datta, S.S. / Ravindran, V.R. | Tema Archiv | 2001
    Schlagwörter: zerstörungsfreie Prüfung

    3-layered 3D flex based MCM: electrical characterization and reliability issues

    Morrison, W.B. / Railkar, T.A. / Malshe, A.P. et al. | Tema Archiv | 1999
    Schlagwörter: Prüfung integrierter Schaltungen

    4D automatic flight path control in pilot assistance system

    Bantle, Jochen / Melz, Christian | Tema Archiv | 2009
    Schlagwörter: Test (Prüfung)

    20 Years of Precision Orbit Determination for Altimetry with GPS

    Bertiger, Willy / Desai, Shailen / Dorsey, Angie et al. | NTRS | 2013
    Schlagwörter: Spacecraft Design, Testing And Performance

    2010-4360 Application of the Boundary Layer Data System on a Laminar Flow Swept Wing Model In Flight

    Bender, A. / Westphal, R. / Drake, A. et al. | British Library Conference Proceedings | 2010
    Schlagwörter: Ground testing

    2010-4804 High-Speed Thermometry in Reacting Flows Using Hybrid fd/ps CARS

    Stauffer, H. / Miller, J. / Slipchenko, M. et al. | British Library Conference Proceedings | 2010
    Schlagwörter: Ground testing

    12830C Lance Missile No. 3338, Round No. 316 ESL

    NTIS | 1978
    Schlagwörter: Flight testing

    12832A Lance Missile No. 3330, Round No. 315 ACT

    NTIS | 1978
    Schlagwörter: Flight testing

    14822B Lance Missile Number 3329, Round Number 314 AST

    NTIS | 1978
    Schlagwörter: Flight testing

    A 3D model for eddy current inspection in aeronautics. Application to riveted structures

    Paillard, S. / Pichenot, G. / Lambert, M. et al. | Tema Archiv | 2007
    Schlagwörter: zerstörungsfreie Prüfung

    A 150-MHz 1.25 mu m CMOS/SOS DSP integrated circuit

    Marking, W.L. / Powell, S.R. / Siviy, R.R. et al. | Tema Archiv | 1989
    Schlagwörter: HIGH SPEED TESTING

    Ableitung von Inspektionsintervallen für Radsatzwellen auf Basis bruchmechanischer Methoden

    Luke, M. / Varfolomeev, I. | Tema Archiv | 2010
    Schlagwörter: bruchmechanische Prüfung

    A Boundary Scan Test Vehicle for Direct Chip Attach Testing

    Parsons, H. | NTRS | 1999
    Schlagwörter: Testing

    A Boundary Scan Test Vehicle for Direct Chip Attach Testing

    Parsons, H. | NTRS | 1999
    Schlagwörter: Testing

    Abrasive wear of railway track by solid contaminants

    Grieve, D.G. / Dwyer-Joyce, R.S. / Beynon, J.H. | Tema Archiv | 2001
    Schlagwörter: mechanische Prüfung

    A breakthrough in high-speed digital eddy current testing technology

    Gopalan, Aschwin M. / Junger, Martin | Tema Archiv | 2008
    Schlagwörter: zerstörungsfreie Prüfung

    A Brief Review on NDT&E Methods For Structural Aircraft Components

    Freier Zugriff
    Wronkowicz-Katunin Angelika | DOAJ | 2018
    Schlagwörter: non-destructive testing

    Abschlussbericht zum Projekt TOP-Design.Toleranzoptimiertes Design

    Ströhlein, T. / Borgwardt, H. / Knote, A. et al. | Tema Archiv | 2011
    Schlagwörter: zerstörungsfreie Prüfung

    Absicherung der Lebensdauer von Triebwerkskomponenten mit ZfP am Beispiel von Scheibe und Schaufel

    Feist, W.D. / König, G. | Tema Archiv | 1998
    Schlagwörter: zerstörungsfreie Prüfung

    A CAD tool for developing fault-to-failure damage progression models for condition-based maintenance systems

    Fujimoto, William T. | Tema Archiv | 2004
    Schlagwörter: virtual fatigue testing

    A capacitive ice detection microsensor

    Roy, S. / DeAnna, R.G. / Mehregany, M. et al. | Tema Archiv | 2000
    Schlagwörter: dynamische Prüfung

    Accelerated acid etch. Part II: Refined test procedure to reproduce automotive acid etch provides improved lab practicality and proven correlation

    Boisseau, J. / Campbell, D. / Marino, M. et al. | Tema Archiv | 2008
    Schlagwörter: beschleunigte Prüfung

    Accelerated Reliability Qualification in Automotive Testing

    Porter, Alex | Tema Archiv | 2004
    Schlagwörter: beschleunigte Prüfung

    Accelerated slam testing of vehicle door plate module using vibration exciter

    Kim, Chan-Jung / Lee, Bong-Hyun / Kang, Yeon June | Tema Archiv | 2013
    Schlagwörter: beschleunigte Prüfung

    Accelerated test based on eis to predict buried steel pipe corrosion

    Goodman, N.B. / Muster, T.H. / Davis, P. et al. | Tema Archiv | 2013
    Schlagwörter: beschleunigte Prüfung

    Accelerated testing of flip chip packages under dynamic load

    Rau, I. / Miessner, R. / Liebing, G. et al. | Tema Archiv | 2001
    Schlagwörter: dynamische Prüfung , beschleunigte Prüfung

    Accelerated Testing of Thermal Control Coatings Using Synchrotron Radiation and Evaluation of Materials Performance

    Fischer, H. R. / Butenko, Yu. V. / Mooney, C. et al. | Springer Verlag | 2012
    Schlagwörter: Accelerated testing

    Acceleration Effects on the Cooling Performance of a Partially Confined FC-72 Spray

    Michalak, Travis E. / Yerkes, Kirk L. / Thomas, Scott K. et al. | AIAA | 2010
    Schlagwörter: Flight Testing

    Acceptance criteria for the onshore and offshore pipeline and steel catenary risers

    Connelly, T.S. / Gross, B. | Tema Archiv | 2006
    Schlagwörter: zerstörungsfreie Prüfung

    Acceptance of EMAT based in-line inspection technology for the assessment of stress corrosion cracking and other forms of cracking in pipelines

    Beuker, Thomas / Doescher, Claus / Brown, Bryce | Tema Archiv | 2009
    Schlagwörter: In-line-Prüfung

    Acceptance tests of distributed processing orientated supervisory control and data acquisition (SCADA) systems for offshore platforms

    Ray, S.K. | Tema Archiv | 1989
    Schlagwörter: BATCH TESTING , ACCEPTANCE TESTING , SEMIAUTOMATED TESTING

    Accounting for Finite Flash Duration in Diffusivity Experiments

    McMasters, Robert L. / Dinwiddie, Ralph B. | AIAA | 2010
    Schlagwörter: American Society for Testing and Materials

    Accuracy control. The keystone of quality in shipbuilding

    Hardison, R.R. | Tema Archiv | 1998
    Schlagwörter: zerstörungsfreie Prüfung

    Accuracy of measurement of thickness of a 6061 aluminum sample at 1-mm lift off

    Schmidt, W.F. / Zinke, O.H. | Tema Archiv | 2002
    Schlagwörter: zerstörungsfreie Prüfung

    Accurate, high-throughput, low-cost testing of infrared focal plane arrays for defense-related systems [2474-27]

    Orias, G. / SPIE | British Library Conference Proceedings | 1995
    Schlagwörter: focal plane array testing