Synonyme wurden verwendet für: metrology
Suche ohne Synonyme: keywords:(optical metrology)

1–11 von 11 Ergebnissen
|

    Rules for Optical Testing

    H. P. Stahl | NTIS | 2016
    Schlagwörter: Optical measurement , Optical properties , Metrology

    Overview of Differential Deposition at NASA MSFC

    M. Gubarev | NTIS | 2016
    Schlagwörter: Metrology , Optical coatings

    MSFC Surface Metrology (Surface Morphology)

    A. P. Shapiro | NTIS | 2001
    Schlagwörter: Metrology , Optical equipment

    Toolbox of Metrology-Based Techniques for Optical System Alignment

    P. Coulter / R. G. Ohl / D. A. Kubalak et al. | NTIS | 2016
    Schlagwörter: Optical measuring instruments , Metrology

      Toolbox of Metrology-Based Techniques for Optical System Alignment

      P. Coulter / R. G. Ohl / S. L. Hicks et al. | NTIS | 2016
      Schlagwörter: Metrology , Optical measuring instruments , Optical equipment

    Development of X-Ray Optics at MSFC

    M. V. Gubarev | NTIS | 2014
    Schlagwörter: Optical microscopes , Optical correction procedure , Metrology

    Testing the James Webb Space Telescope (JWST) Primary Mirror

    H. P. Stahl | NTIS | 2014
    Schlagwörter: Optical equipment , Metrology

    Surface Profile Correction of Replicated X-Ray Optics Through Differential Deposition

    K. Kilaru / C. Atkins / B. D. Ramsey et al. | NTIS | 2011
    Schlagwörter: Optical Detection , Metrology

    Differential Deposition for Figure-Corrections in Grazing-Incidence X-Ray Optics

    K. Kilaru / B. D. Ramsey / M. Gubarev et al. | NTIS | 2011
    Schlagwörter: Optical Detection , Metrology

    Rules for Optical Metrology

    H. P. Stahl | NTIS | 2011
    Schlagwörter: Metrology , Optical equipment

    NASA Funding Opportunities for Optical Fabrication and Testing Technology Development

    H. P. Stahl | NTIS | 2013
    Schlagwörter: Optical equipment , Metrology

    Coherent Optical Methods for Applications in Robot Visual Sensing

    J. Taboada | NTIS | 1981
    Schlagwörter: Coherent optical radiation , Optical data , Metrology