X-ray natural circular dichroism (XNCD) in gyrotropic crystals [3773-35]
X-ray mirror metrology: I. Accurate processing of profilometry data [3773-17]
Water-cooled first crystals for the SPring-8 x-ray undulator beamlines [3773-02]
Ultrafast time-resolved EXAFS spectroscopy using an energy dispersive spectrometer [3773-24]
Two-wave x-ray methods for characterization of supersmooth substrates and thin films [3773-20]
Thermal management of next-generation contact-cooled synchrotron x-ray mirrors [3773-09]
Theory of x-ray multilayers with graded period [3773-15]
Sub-rad angular stability measurements by use of long-trace-profiler-based systems [3773-18]
R&D program on multisegmented piezoelectric bimorph mirrors at the ESRF-status report: II [3773-06]
Phase plates for x-ray optics (Invited Paper) [3773-36]
Optical components for polarization analysis of soft x-ray radiation [3773-25]
Microfocusing between 1 and 5 keV with Wolter-type optics [3773-07]
Metrology of the mirrors at the Taiwan Light Source [3773-16]
Magnetic x-ray measurements using the elliptical multipole wiggler [3773-30]