1–50 von 88 Ergebnissen
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    Venus sample return. A hot topic

    Rodgers, D. / Gilmore, M. / Sweetser, T. et al. | IEEE | 2000

    Two-dimensional endoscopic MEMS scanner for high resolution optical coherence tomography

    Piyawattanametha, W. / Fan, L. / Hsu, S. et al. | IEEE | 2004

    Towards Faster Vehicle Routing by Transferring Knowledge From Customer Representation

    Feng, Liang / Huang, Yuxiao / Tsang, Ivor W. et al. | IEEE | 2022

    The Evolution of planetary protection implementation on Mars landed missions

    Kazarians, Gayane A. / Benardini, James N. / Stricker, Moogega C. et al. | IEEE | 2017

    The Effect of Temperature Change on the Plasma Reflectance

    Yang, H. W. / Yuan, H. / Chen, R. S. et al. | IEEE | 2006

    The Benefits of Large-Scale Attenuation over the Antenna Array in Massive MIMO Systems

    Liu, Liu / Matolak, David W. / Tao, Cheng et al. | IEEE | 2016

    Telerobotics: problems and research needs

    Stark, L. / Tendick, F. / Kim, W. et al. | IEEE | 1988

    System concepts and technologies for high orbit SAR

    Moussessian, A. / Chen, C. / Edelstein, W. et al. | IEEE | 2005

    Stabilities study of the current agriculture use UAV and future design

    Hsieh, Y. C. / Kuo, C. H. / Wang, Y. T. et al. | IEEE | 2018

    Single Event Effects Compendium of Candidate Spacecraft Electronics for NASA

    O'Bryan, Martha V. / LaBel, Kenneth A. / Pellish, Jonathan A. et al. | IEEE | 2009

    Simulation study of wideband interference rejection using STAP

    Au, W. / Chen, L. / Loo, K. et al. | IEEE | 2006

    Selective growth of II-VI materials on Si(211): First-principle calculations

    Huang, Y. / Chen, X. S. / Duan, H. et al. | IEEE | 2006

    Scanning the Issue

    Ioannou, Petros / Sun, J. / Li, T. et al. | IEEE | 2018

      Scanning the Issue

      Ioannou, Petros / Al-Hourani, A. / Evans, R. J. et al. | IEEE | 2018

    Scanning the Issue

    Eskandarian, Azim / Jung, S. / Hong, S. et al. | IEEE | 2019

    Rate-equation modeling of spectrum and dynamic properties of quantum-dot lasers

    Chen, H.-T. / Hsieh, W.-H. / Mao, M.-H. | IEEE | 2003

    Rapid Thermal Annealing Effect On Valence-band Splitting Behavior in GaNxAs1-x/GaAs

    Liu, Z. L. / Chen, P. P. / Wang, C. et al. | IEEE | 2006

    Properties of MBE Growth InN: Cr Films

    Chen, P. P. / Lu, W. / Makino, H. et al. | IEEE | 2006

    Planar Lightwave Circuit Technology-based Optical Interleavers

    Chan, H. P. / Wu, Q. / Chen, K. X. et al. | IEEE | 2008

    Photonics in optically-induced lattices

    Neshev, D. / Sukhorukov, A.A. / Ostrovskaya, E.A. et al. | IEEE | 2004

    Path Loss Modeling and Ray-Tracing Verification for 5/31/90 GHz Indoor Channels

    Liu, Jinwen / Matolak, David W. / Mohsen, Mohanad et al. | IEEE | 2019

    Particle filter based on improved genetic algorithm resampling

    Wang, W. / Tan, Q. K. / Chen, J. et al. | IEEE | 2016

    Optical properties of InN films grown by MBE at different conditions

    Chen, P.P. / Makino, H. / Wang, J.B. et al. | IEEE | 2004

    On Quantifying Cost-Benefit of ISHM in Aerospace Systems

    Hoyle, C. / Mehr, A. / Tumer, I. et al. | IEEE | 2007

    Numerical Simulation and Experimental Research on Thermo-Mechanical-Wear Coupling

    Chen, P. F. / Xiong, Y. X. / He, J. W. et al. | IEEE | 2018

    Nanophotonics for optoelectronic system integration

    Fainman, Y. / Tetz, K. / Levy, U. et al. | IEEE | 2004

    Nanophotonic materials and devices for optical system integration

    Fainman, Y. / Nakagawa, W. / Tsai, C.-H. et al. | IEEE | 2002

    Modeling of Two-color HgCdTe Detectors

    Xu, X. Y. / Ye, Zh. H. / Lu, W. et al. | IEEE | 2006

    MAVEN contamination venting and outgassing analysis

    Petro, Elaine M. / Hughes, David W. / Secunda, Mark S. et al. | IEEE | 2014

    Mars Science Laboratory: Entry, Descent, and Landing System Performance

    Way, David W. / Powell, Richard W. / Chen, Allen et al. | IEEE | 2007

    Mars Science Laboratory Entry, Descent, and Landing System Overview

    Prakash, Ravi / Burkhart, P. Dan / Chen, Allen et al. | IEEE | 2008