1–7 von 7 Ergebnissen
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Ihre Suche:
person:(Carneiro, A. P. B.)

    Aerial image analysis for defective masks in optical lithography

    Graf, T. / Erdmann, A. / Evanschitzky, P. et al. | IEEE | 2005

    Computationally efficient face detection

    Romdhani, S. / Torr, P. / Scholkopf, B. et al. | IEEE | 2001

    Driver state monitor from DELPHI

    Edenborough, N. / Hammoud, R. / Harbach, A. et al. | IEEE | 2005

    Growth of thin plates of DAST and thin films for nonlinear optic applications

    Ruiz, B. / Schneider, A. / Manetta, S. et al. | IEEE | 2005

    Learning spectral calibration parameters for color inspection

    Carvalho, P. / Santos, A. / Dourado, A. et al. | IEEE | 2001

    Real time 3D nonlinear microscopy

    Fekete, J. / Banyasz, A. / Szipocs, R. et al. | IEEE | 2005

    Texture feature characterization for logical pre-labeling

    Allier, B. / Duong, J. / Gagneux, A. et al. | IEEE | 2003