Infrared interferometer for optical testing [2860-24]
Investigation of speckle displacement effects on speckle interferometry [2860-47]
Laser optical strain sensor: technique and applications [2860-23]
Leaky waveguide laser diodes for advances manufacturing and metrology [2860-38]
Least-squares fitting of a sinusoidal signal and its Fourier analysis [2860-09]
Light-in-flight measurements by digital holography [2860-16]
MC5-54 Development of a New Commercial THz-TDS Instrument
Measuring convergence or divergence power with moire fringes [2860-48]
Modified in-plane electronic speckle pattern shearing interferometry (ESPSI) [2860-28]
Nonoptical surface measurement by oblique incidence interferometry [2860-34]
On the Fatigue Life Evaluation of Cylinder Head for High Speed Diesel Engines
Optical device positioning by using Becke lines [2860-31]
Optical flat surfaces: subtraction of small-scale irregularities of the reference surface [2860-35]
Optoelectronic developments in speckle interferometry (Invited Paper) [2860-22]
Phase-shifted real-time laser feedback interferometry [2860-29]