1–10 von 10 Ergebnissen
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    Analysis of Sputtering Yield Measurements for Ion Thruster Grid Materials

    He, Zihao / Miao, Long / Zhu, Zhengxi et al. | AIAA | 2023
    Schlagwörter: Secondary Ion Mass Spectrometry

    Surface Modification of Space-Related Flat Cable Conductors by a Novel Technological Process

    Iskanderova, Zelina / Kleiman, Jacob / Grigorevski, A. et al. | AIAA | 2016
    Schlagwörter: Secondary Ion Mass Spectrometry

    Tribochemistry on clutch friction material lubricated by automatic transmission fluids and the link to frictional performance

    Zhao, Hongyuan / Morina, Ardian / Neville, Anne et al. | Tema Archiv | 2013
    Schlagwörter: Sekundärionenmassenspektrometrie

    Impact of polymer surface affinity of novel antifouling agents

    Dahlström, M. / Jonsson, P.R. / Lausmaa, J. et al. | Tema Archiv | 2004
    Schlagwörter: Sekundärionenmassenspektrometrie

    FIB-SIMS analysis of micro-particle impacts on spacecraft materials returned from low-earth orbit

    Kettle, S. / Chater, R.J. / Graham, G.A. et al. | Tema Archiv | 2004
    Schlagwörter: Sekundärionenmassenspektrometrie

    Collision cascade temperature

    Kudriavtsev, Yuriy / Asomoza, Rene | Tema Archiv | 2008
    Schlagwörter: Sekundärionenmassenspektrometrie

    Analytical series: Secondary ion mass spectrometry of automotive coating systems

    Simko, Steven J. / Kaberfine, Steven L. / Haack, Larry P. | Tema Archiv | 2011
    Schlagwörter: Sekundärionenmassenspektrometrie

    Hydrogen-facilitated anodic dissolution-type stress corrosion cracking of pipeline steels in near-neutral pH solution

    Gu, B. / Luo, J. / Mao, X. | Tema Archiv | 1999
    Schlagwörter: Sekundärionenmassenspektrometrie

    SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys

    Gritsch, M. / Piplits, K. / Barbist, R. et al. | Tema Archiv | 2001
    Schlagwörter: Sekundärionenmassenspektrometrie

    Advanced III-V materials processing in the vacuum of space

    Ignatiev, A. / Horton, C. / Sterling, M. et al. | Tema Archiv | 1994
    Schlagwörter: Sekundärionenmassenspektrometrie