A control device: a beam structure of charged particles [5126-50]
Electron emission from a glass surface subjected to an intensive electron beam
Variations of MCT photoconductor performance with background flux density [5126-29]
Negative infrared photoconductivity in CdS~1~-~xSe~x films [5126-46]
Isolating surface and bulk contributions in an HgCdTe junction diode [5126-25]
Laser-and-holographic measuring complex of FSPC GIPO [5126-37]
The state of the art and prospects of Cd~xHg~1~-~xTe molecular beam epitaxy [5126-48]