Detection of anomalies in an image by wavelet analysis [2034-38]
Ultrafast time-resolved optical multichannel analyzer [2321-53]
Measurement error caused by white-light spectrum in fringe scanning interferometry [2321-60]
Study of photovoltaic properties of Ge~xSi~1~-~x/Si quantum well structures [2321-29]
Self-reference single-plate shearing interferometric technique and its application [2321-61]
All-solid lithiated electrochromic devices for transmissive light control [2321-35]
Requirements for temporal coherence in x-ray holography [2321-161]
Efficient induced mutual pumped phase conjugation in Cu:KNSBN [2321-14]
Theoretical and experimental research on traveling-wave semiconductor laser amplifiers [2321-101]
Effect of aberration on the direct reconstruction of x-ray holograms with visible light [2321-163]
High-speed rail flaw pattern recognition and classification [2458-05]
Binary optics for elliptical Gaussian beam to circular flattop beam transformation [2886-532]
Wafer bonding technique for fabricating 1.5-m InGaAs/InGaAsP pillar-free microdisk lasers [2886-548]
Optically pumped ZnSe-ZnS MQWs blue vertical cavity surface emitting lasers [2886-546]