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Ihre Suche:
person:("Kiser, James D.")

    Statistical Tests of Reliability of NDE

    Baaklini, George Y. / Klima, Stanley J. / Roth, Don J. et al. | NTRS | 1987

    Reliability Of Inspection By SLAM

    Roth, Don J. / Klima, Stanley J. / Kiser, James D. et al. | NTRS | 1988

    Radiographic Detection Of Voids In SiC And SiN Ceramics

    Baaklini, George Y. / Kiser, James D. / Roth, Don J. | NTRS | 1991