This chapter focuses on problems face by FPGA space applications and fault‐tolerance techniques of SRAM‐based FPGA. The effects of the space environment on FPGA include total dose effect and single event effect (SEE). With the development in manufacturing processes, anti‐fuse‐based FPGA and SRAM‐based FPGA are being applied in current onboard electrical products, and are able to meet the total dose requirements of the space environment. When fully utilizing the configuration flexibility of SRAM‐based FPGA, it is very important to take protective measures against sensitivity of SRAM‐based FPGA to single event upset (SEU) in the space environment. Selection of SEU protective measures for SRAM‐based FPGA space application should be based on the application scenario to acquire cost performance. The chapter introduces realization of automatic scrubbing, read‐back, and the reconfiguration technique based on ICAP.


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    Titel :

    Fault‐Tolerance Techniques for FPGA


    Beteiligte:
    Yang, Mengfei (Autor:in) / Hua, Gengxin (Autor:in) / Feng, Yanjun (Autor:in) / Gong, Jian (Autor:in)


    Erscheinungsdatum :

    2017-03-15


    Format / Umfang :

    53 pages




    Medientyp :

    Aufsatz/Kapitel (Buch)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch




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