The Texas Department of Transportation (TxDOT) is implementing smoothness specifications based on profilograph testing as part of its construction quality control/quality assurance (QC/QA) program. Automated California-type profilographs are now used in most tests, in which the equipment is pushed over a prescribed wheelpath. It appears that smoothness specifications will continue to be based on the profilograph, at least for the short term. However, in view of advances in profiling technology, it becomes prudent to investigate other methods of measuring surface profiles and to develop smoothness specifications based on profilers that offer greater accuracy and higher production rates. In pursuit of its goal of providing smooth pavements, TxDOT initiated a research project with the Texas Transportation Institute to develop a smoothness specification for asphalt concrete overlays based on the new generation of pavement profilers, which offer greater accuracy in profile measurement relative to the profilographs now used in construction projects. Among other things, this research project evaluated a number of profile-measuring devices to establish the availability of equipment for implementing a new profile-based smoothness specification in Texas. This evaluation showed that lightweight profilers provide a basis for developing and implementing smoothness specifications that are based on surface profile. Since surface smoothness is commonly monitored using inertial profilers in pavement condition surveys conducted for pavement management, having the initial profile allows highway agencies to tie the as-built smoothness to the rest of the performance history and thus maintain a consistent historical record of surface smoothness throughout the pavement life cycle.
Evaluation of Accuracy of Surface Profilers
Transportation Research Record
Transportation Research Record: Journal of the Transportation Research Board ; 1699 , 1 ; 127-133
2000-01-01
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
Evaluation of Accuracy of Surface Profilers
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