In order to create a viable photovoltaics (PV) database for planetary mission planners and cell designers, the authors have compiled low-intensity low-temperature (LILT) I-V data on single-junction and multijunction high-efficiency solar cells. The cells tested here represent the latest PV technology. Using these LILT data to calculate short-circuit current, open-circuit voltage and fill factor as a function of temperature and intensity, an accurate prediction of cell performance under the AM0 spectrum can be determined. When combined with quantum efficiency at low temperature data, one can further enhance the data by adding spectral variations to the measurements. This paper presents an overview of LILT measurements and is only intended to be used as a guideline for material selection and performance predictions. As single-junction and multi-junction cell technologies emerge, new test data must be collected. Cell materials included are Si, GaAs/Ge, GalnP/GaAs/GaAs, InP, InGaAs/InP, InP/InGaAs/InP and GaInP. Temperatures range down to as low as -180 degrees C and intensities range from 1 sun down to 0.02 sun. The coefficients presented in this paper represent experimental results and are intended to provide the user with approximate numbers
Low-intensity low-temperature (LILT) measurements and coefficients on new photovoltaic structures
Niedrig-Intensitäts-Niedrig-Temperatur-Messungen (LILT-Messung) und Koeffizienten bei neuen photovoltaischen Strukturen
1996
11 Seiten, 8 Quellen
Aufsatz (Konferenz)
Englisch
Low-intensity Low-temperature (LILT) Measurements and Coefficients on New Photovoltaic Structures
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