Limiting Zener diode circuits are often used in ground support equipment for the Minuteman Missile. These circuits protect sensitive transistor and resistor components from electrical surges. Data were collected for 110 waveforms for a combination of good circuits and the most frequently encountered failure modes, including shorted diodes, open diodes and bad amplifiers. The data were then used to train a neural network pattern recognition system to see if neural network technology could correctly identify good versus bad protection circuits. When trained using all of the diodes, the neural network was able to identify correctly all of the circuits and associated failure models. To validate the neural network model, a subset of 59 samples was randomly selected for training of the neural network, and the remaining 51 samples were used for testing. In both instances, the network did an excellent job (100%) of identifying failure.


    Zugriff

    Zugriff prüfen

    Verfügbarkeit in meiner Bibliothek prüfen

    Bestellung bei Subito €


    Exportieren, teilen und zitieren



    Titel :

    Neural networks in automatic testing of diode protection circuits


    Weitere Titelangaben:

    Nervennetzwerke bei der automatischen Prüfung von Dioden-Schutzschaltungen


    Beteiligte:
    Allred, L.G. (Autor:in)


    Erscheinungsdatum :

    1989


    Format / Umfang :

    6 Seiten, 8 Quellen



    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Automatic Parametric Testing Of Integrated Circuits

    Jennings, Glenn A. / Pina, Cesar A. | NTRS | 1989


    Optoelectronic Integrated Circuits For Neural Networks

    Psaltis, D. / Katz, J. / Kim, Jae-Hoon et al. | NTRS | 1990


    Automatic testing of rigid risers using time of flight diffraction and neural networks

    Carvalho, A.A. de / Siqueira, M.H.S. / Silva, I.C. da et al. | Tema Archiv | 2004


    Open flyback diode protection

    FOX BRENNAN / VANDERGRIFT ADRIAN E | Europäisches Patentamt | 2023

    Freier Zugriff

    Neural networks for automatic target recognition

    Chaudhuri, S.P. / Sequeira, C. | Tema Archiv | 1990