The development of a circuit card test capability for the forward repair depot at Kadena Air Base, Japan, is described. This depot is known as the Support Center Pacific (SCP). The purpose was to provide the SCP with the tools they needed to repair circuit cards in the Far East. To meet the urgent need for an on-site test and repair capability, a novel piece of automatic test equipment was developed called the Interface Test Adapter, and a concept of testing, which states that 'less is better', was formulated. Results from over three years of SCP implementation are given.


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    Titel :

    The evolution of a test concept active components in the interface test adapter


    Weitere Titelangaben:

    Die Entwicklung der aktiven Testkonzeptkomponenten im Interface-Pruefadapter


    Beteiligte:
    Lynds, J.S. (Autor:in)


    Erscheinungsdatum :

    1987


    Format / Umfang :

    3 Seiten


    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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